News & Public Relations
Ricmar introduces Inspection System for Transparent Wafers
Date: 21 Oct 2009Based on special customer inquiries Ricmar now offers a fully automated optical inspection system for sapphire wafers. The system incorporates a fully automated and cost efficient handling system and user friendly and easy adaptable software. The integrated inspection module is dedicated for 2D inspection of transparent wafers.
For more information please contact: info@ricmar.com
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Purchase Order for Defect Inspection System
Date: 6 Aug 2009One of the leading producers of lithography systems in the US has recently placed an order at NanoPhotonics AG, Mainz, a Ricmar Business Member. The NanoPhotonics system provides state-of-the-art defect inspection on photo masks and will optimize the customers production process.
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ISMI to Report Progress at Semicon West
Date: 10 Jul 2009
At next week's SEMICON West show, ISMI will meet the supplier community to discuss progress with the 450 mm and Next Generation Factory programs. The 450 mm effort is moving from automation and wafer handling testing to demonstration wafer processing equipment. Updated metrics for 60 different types of equipment were posted to the ISMI website early today.
By David Lammers, News Editor -- Semiconductor International, July 6, 2009
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